The JEOL JSM-7500F is a cold field emission scanning electron microscope (SEM) designed for ultra high resolution images. The SEM allows us to observe (even non-conductive) specimens at high resolution without the need of any special preparation. Below are some images taken with the different detectors of the JSM-7500F.

  • Specifications
    • Acceleration voltage: 0.2 kV – 30 kV
    • Resolution: 1.0 nm at 15 kV (1.4 nm at 1 kV)
  • Detectors:
    • secondary electron detector (SE)
    • low-angle backscattering detector (LABe)
    • transmission electron detector (TED,STEM)
    • energy dispersive X-ray detector from Bruker (EDX)

C. Notthoff, M. Winterer, A. Beckel, M. Geller, and J. Heindl, Spatial high resolution energy dispersive X-ray spectroscopy on thin lamellas, Ultramicroscopy 129 (2013), 30-35

ZnO nanoparticles


SE-Image of as prepared ZnO nanoparticles

SEI_CS_ZnO_on_TEM_grid TED_CS_ZnO_on_TEM_grid

SE-Image (left) and STEM-Image (right) of ZnO nanoparticles on a TEM-grid


 GaAs/AlAs heterostructure with embedded GaSb quantum dots

Map2_Bild Map2_Al

STEM-Image (left) and Al-EDX map (right)

Map2_Ga Map2_O

Ga-EDX map (left) and O-EDX map (right)